From software simulation (HIL) to hardware test benches (testing equipment), a full-scenario solution for intelligent chassis is achieved through the technical closed loop of physical testing and virtual verification. The presentation will cover the necessity of multi-degree-of-freedom testing for x-by-wire chassis, pain points in x-by-wire chassis testing, application of multi-degree-of-freedom testing technology for x-by-wire chassis, HIL testing system for intelligent chassis, and high-dynamic testing bench for intelligent chassis.

• The industry situation and development trends of intelligent chassis
• The necessity for and testing methods of multi-degree-of-freedom testing for intelligent chassis
• The principles of HIL testing for intelligent chassis and the principles of high-response testing benches